Select Show more to show the Save file to options.

For example, you can save the file in different file formats-such as JPEG, Bitmap, and PNG. Under File type, select the type of file you want the scan to be saved as. Under Source, select the location you prefer to scan from. Under Scanner, select the scanner you want to use. Place the item you want to scan in the scanner's document feeder. Place the item you want to scan face down on the scanner's flatbed and close the cover. In the search box on the taskbar, type Windows Scan, and then select Scan from the results. The NXE:3400C incorporates the second-generation level sensor, based on UV light source that reduces process dependencies from product wafers.Note: Need to install the Windows Scan app? You can get the app at Microsoft Store. Wafer alignment occurs at the measurement position with target detection using the ORION alignment sensor with ASML's proven phase grating alignment technique. Overlay accuracy is measured over the whole field and over the whole wafer. The NXE:3400C can achieve a dedicated chuck overlay of 1.4 nm and a matched-machine overlay of 1.5 nm. In-situ measurement and corrections per wafer of the optics and stages enable maximum imaging, overlay and CDU performance for each wafer exposed when imaging at low k1. The system is equipped with projection optics with a numerical aperture (NA) of 0.33 and an illuminator with an operating range sigma of 0.06–1 to maintain high productivity while enabling low k1 and a resolution of 13 nm. The NXE:3400C features an all-reflective 4x reduction lens assembly from Zeiss with a maximum exposure field of 26 x 33 mm. Throughput is larger than or equal to 135 wafers per hour at a dose of 30 mJ/cm 2.

The 300 mm wafer throughput specification for the NXE:3400C is larger than or equal to 170 wafers per hour at a dose of 20 mJ/cm 2.

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